The FDP aims to provide comprehensive knowledge of SEM and TEM principles, instrumentation, sample preparation, imaging and data interpretation. It will highlight multidisciplinary applications in materials characterization, encourage collaborative research and strengthen participants’ practical understanding of advanced microscopy techniques.
- Who can join
- Faculty members and research scholars in Mechanical Engineering and Materials Science.
- Faculty members from Civil Engineering, Electrical and Electronics Engineering, Chemical Engineering and Biotechnology.
- Faculty members from Computer Science and Engineering, Artificial Intelligence and Data Science and Information Technology.
- Researchers working on composite materials, nanomaterials, polymers, alloys, biomaterials and advanced engineering materials.
- Academicians and research professionals interested in SEM, TEM, microstructural characterization and AI based microscopic image analysis.
- Postgraduate students and research scholars involved in interdisciplinary materials research.
- Events & highlights
- Greetings from A.V.C. College of Engineering (Autonomous), Mannampandal, Mayiladuthurai District, Tamil Nadu.
The Department of Mechanical Engineering and the Department of Computer Science and Engineering, are pleased to invite you to participate in the Two Days Offline Faculty Development Programme on “Advanced Electron Microscopy for Materials Characterization: SEM and TEM in Multidisciplinary Research”.
Date: 26.11.2026 & 27.11.2026
Venue: A.V.C. College of Engineering, Mannampandal
Resource Person: Dr. S. Sankaran, Professor, Department of Metallurgical and Materials Engineering, IIT Madras and General Secretary, Electron Microscopy Society of India (EMSI).
Registration Fee: Rs. 300/- per participant
Last Date for Registration: 23.11.2026
Registration Confirmation: 24.11.2026
Limited Participants: 45
We invite all faculty members, research scholars, PG students and academicians to register and benefit from this valuable learning opportunity.
Ready to participate in Advanced Electron Microscopy for Materials Characterization: SEM and TEM in Multidisciplinary Research 2026?
Secure your pass before registration closes. Connect with the organizing committee for group discounts or queries.